导出 excel导出 txt 已选择0条

• 1 弱磁材料透气性的标准试验方法 - 摘要
  

  3.1x00a0;This test method is suitable for specification acceptance, design purposes, service evaluation, regulatory statutes, manufacturing control, and research and development.

  3.2x00a0;Because of the restrictions on the specimen shape and size, this test method is most often used to evaluate semifinished product before fabrication of parts.

  1.1x00a0;These test methods cover four procedures for determination of the permeability [relative permeability]² of materials having a permeability not exceeding 6.0.

  1.2x00a0;The test methods covered are as follows:

  1.2.1x00a0;Test Method 1x2014;Fluxmetric Method is suitable for materials with permeabilities between 1.0 and 4.0. This method permits the user to select the magnetic field strength at which the permeability is to be measured.

  1.2.2x00a0;Test Method 2x2014;Permeability of Paramagnetic Materials has been eliminated as an acceptable method of test.

  1.2.3x00a0;Test Method 3x2014;Low Mu Permeability Indicator is suitable for measuring the permeability of a material as x201c;less thanx201d; or x201c;greater thanx201d; that of calibrated standard inserts with permeability between 1.01 and 6.0, as designated for use in a Low-Mu Permeability Indicator.³ In this method, a small volume of specimen is subjected to a local magnetic field that varies in magnitude and direction, so it is not possible to specify the magnetic field strength at which the measurement is made.

  1.2.4x00a0;Test Method 4x2014;Flux Distortion is suitable for materials with permeability between 1.0 and 2.0. In this method, a small volume of specimen is subjected to a local magnetic field that varies in magnitude and direction, so it is not possible to specify the magnetic field strength at which the measurement is made.⁴

  1.2.5x00a0;Test Method 5x2014;Vibrating Sample Magnetometry is suitable for materials with permeability between 1.0 and 4.0. This test method permits the user to select the magnetic field strength at which the permeability is to be measured.

  1.3x00a0;Materials typically tested by these methods such as austenitic stainless steels may be weakly ferromagnetic. That is, the magnetic permeability is dependent on the magnetic field strength. As a consequence, the results obtained using the different methods may not closely agree with each other. When using Methods 1 and 5, it is imperative to specify the magnetic field strength or range of magnetic field strengths at which the permeabilities have been determined.

  1.4x00a0;The values and equations stated in customary (cgs-emu and inch-pound) or SI units are to be regarded separately as standard. Within this standard, SI units are shown in brackets except for the sections concerning calculations where there are separate sections for the respective unit systems. The values stated in each system may not be exact equivalents; therefo......

• ASTM A342/A342M-2014 - 中外标准 - ASTM- 2014/1 - 现行
• 关键词：磁化率  NDE  渗透率  渗透性  渗透计  magnetic balances  magnetic probes  magnetic susceptibility  NDE  nondestructive evaluations  paramagnetics  permeability  permeameters  vibrating sample magnetometers
  

• 2 与磁性试验有关的符号和定义的标准术语 - 摘要
  
  0
• ASTM A340-2014 - 中外标准 - ASTM- 2014/1 - 现行
• 
  

• 3 磁性材料叠装系数的试验方法 - 摘要
  

  4.1x00a0;Lamination factor, S, indicates the deficiency of effective steel volume which is due to the presence of oxides, roughness, insulating coatings, and other conditions affecting the steel surface.

  4.2x00a0;The term Lamination Factor, S, pertains strictly to the determination of the proportion of material as defined by precise sampling and procedures of this test method. Alternative usage of the term Lamination Factor has evolved to include sampling and procedures outside of the context of this test method. Consideration of alternative sampling and procedures should not be included within the scope of this test method.

  1.1x00a0;This test method covers measurement of the lamination factor (Note 1) of a specimen composed of strips cut from magnetic material.

  Note 1x2014;Lamination factor is also termed space factor or stacking factor.

  1.2x00a0;This test method shall be used in conjunction with Practice A34/A34M.

  1.3x00a0;The values and equations stated in customary (cgs-emu and inch-pound) or SI units are to be regarded separately as standard. Within this test method, SI units are shown in brackets. The values stated in each system may not be exact equivalents; therefore each system shall be used independently of the other. Combining values from the two systems may result in nonconformance with this test method.

  1.4x00a0;This standard does not purport to address the safety concerns associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

• ASTM A719/A719M-2014 - 中外标准 - ASTM- 2014/1 - 现行
• 关键词：层压因子  lamination factor  space factor  stacking factor
  

• 4 印制电路用镀铜热固层压板的标准规格 - 摘要
  

  1.1x00a0;This specification covers twelve grades of thermosetting laminate with copper foil bonded to one or both surfaces. These combination forms are intended primarily for use in fabrication of printed (etched) wiring or circuit boards.

  1.2x00a0;The values stated in inch-pound units are to be regarded as the standard. The values given in parentheses are for information only.

  1.3x00a0;This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

• ASTM D1867-2013 - 中外标准 - ASTM- 2013/1 - 现行
• 关键词：电路板  敷铜箔板  印刷电路板  circuit board  copper-clad laminate  printed circuit board  printed wiring board  thermosetting laminate
  

• 5 镀银铜及铜合金绞线的电子器件空间应用标准规范 - 摘要
  

  1.1x00a0;This specification covers uninsulated silver-coated soft or annealed copper and copper alloy stranded conductors for use in electronic space application.

  1.2x00a0;The values stated in either SI units or inch-pound units are to be regarded separately as standard. The values stated in each system may not be exact equivalents; therefore, each system shall be used independently of the other. Combining values from the two systems may result in non-conformance with the standard.

  1.3x00a0;This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. This precautionary caveat pertains only to Section 9.

• ASTM B961-2013 - 中外标准 - ASTM- 2013/1 - 现行
• 关键词：电子空间应用  copper-wire silver coated  copper alloy wire silver coated  electronic space application  red-plague corrosion test
  

• 6 电连接器或弹簧触点产品用铜合金带材标准规格 - 摘要
  

  1.1x00a0;This specification establishes the requirements for copper alloy strip for use in the manufacture of electrical connectors or spring contacts produced from one of the following Copper Alloy UNS Nos.²: C14530, C15100, C15500, C17000, C17200, C17410, C17450, C17460, C17500, C17510, C19002, C19010, C19015, C19025, C19210, C19400, C19500, C19700, C23000, C26000, C40810, C40850, C40860, C42200, C42500, C42520, C42600, C50580, C50780, C51000, C51080, C51100, C51180, C51980, C52100, C52180, C52480, C63800, C64725, C65400, C68800, C70250, C70260, C70265, C70310, C75200, and C76200.

  1.2x00a0;The requirements for the other copper alloys such as copper-nickel-tin spinodal, UNS C72650, C72700, and C72900, shall be as prescribed in the current edition of Specification B740.

  1.3x00a0;The values stated in either SI units or inch-pound units are to be regarded separately as standard. The values stated in each system may not be exact equivalents; therefore, each system shall be used independently of the other. Combining values from the two systems may result in non-conformance with the standard.

• ASTM B888/B888M-2013 - 中外标准 - ASTM- 2013/1 - 现行
• 关键词：热膨胀系数  密度  电导率  电连接器  电阻率  延伸  弹性模量  弹簧触点  导热性  屈服强度  coefficient of thermal expansion  density  electrical conductivity  electrical connectors  electrical resistivity  elongation  modulus of elasticity  spring contacts  thermal conductivity  yield strength  UNS No. C14530  UNS No. C15100  UNS No. C15500  UNS No. C17000  UNS No. C17200  UNS No. C17410  UNS No. C17450  UNS No. C17460  UNS No. C17500  UNS No. C17510  UNS No. C19002  UNS No. C19010  UNS No. C19015  UNS No. C19025  UNS No. C19210  UNS No. C19400  UNS No. C19500  UNS No. C19700  UNS No. C23000  UNS No. C26000  UNS No. C40810  UNS No. C40850  UNS No. C40860  UNS No. C42200  UNS No. C42500  UNS No. C42520  UNS No. C42600  UNS No. C50580  UNS No. C50780  UNS No. C51000  UNS No. C51080  UNS No. C51100  UNS No. C51180  UNS No. C51980  UNS No. C52100  UNS No. C52180  UNS No. C52480  UNS No. C63800  UNS No. C64725  UNS No. C65400  UNS No. C68800  UNS No. C70250  UNS No. C70260  UNS No. C70265  UNS No. C70310  UNS No. C72650  UNS No. C72700  UNS No. C72900  UNS No. C75200  UNS No. C76200
  

• 7 电子器件射线检测质量控制方法 - 摘要
  

  1.1 This specification covers requirements or filler metals suitable for brazing internal parts and other critical areas of electron devices in a nonoxidizing atmosphere (Note 1).

  1.2 These materials are available in strip or wire or preforms made by blanking the strip or bending the wire. Powders are also available.

  Note 18212;Brazing filler metals for general applications are specified in AWS Specification A 5.8.

  1.3 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.

• ASTM F106-2012 - 中外标准 - ASTM- 2012/1 - 现行
• 关键词：&numsp  braze alloys  electron devices  melting test for cleanness and spatter  Brazing filler metals  Electronic materials/applications--specifications  Filler metals  Metal electronic components/devices--specifications  UNS P07016 (silver)
  

• 8 印刷线路板用铜覆层热固层压材料的标准试验方法 - 摘要
  

  1.1 These test methods cover the procedures for testing copper-clad laminates produced from fiber-reinforced, thermosetting polymeric materials intended for fabrication of printed wiring boards.

  1.2 The procedures appear in the following sections:

  Procedure	Section
  8199;Referenced Documents	2
  8199;Conditioning	4
  8199;Dielectric Breakdown Voltage Parallel to Laminations	13
  8199;Dimensional Instability	19
  8199;Dissipation Factor	14
  8199;Flammability Rating Test	16
  8199;Flexural Strength, Flatwise at Elevated Temperature	15
  8199;Flexural Strength, Flatwise at Room Temperature	15
  8199;Oven Blister Test	17
  8199;Peel Strength Test at Elevated Temperature	10
  8199;Peel Strength Test at Room Temperature	ASTM D5109-2012 - 中外标准 - ASTM- 2012/1 - 现行 关键词：覆铜箔层压板  层压平行介电击穿  尺寸不稳定性  损耗因数  纤维增强的  挠曲强度  工业用层压板  层压板  烤箱泡  剥离强度  电容率  印刷电路板  印制线路板  刚性层压板  漂锡  表面电阻率  热固性  厚度变化  跟踪  扭曲  体积电阻率  弯曲  吸水率  copper-clad laminate  dielectric breakdown parallel to laminations  dimensional instability  dissipation factor  fiber reinforced  flexural strength  industrial laminate  laminate  oven blister  peel strength  permittivity  printed circuit boards  printed wiring boards  rigid laminate  solder float  surface resistivity  thermoset  thickness variation  trace  twist  volume resistivity  warp  water absorption 9 无偏电子元件中子辐照的标准指南 - 摘要 Semiconductor devices can be permanently damaged by reactor spectrum neutrons (1, 2) . The effect of such damage on the performance of an electronic component can be determined by measuring the componentx2019;s electrical characteristics before and after exposure to fast neutrons in the neutron fluence range of interest. The resulting data can be utilized in the design of electronic circuits that are tolerant of the degradation exhibited by that component. This guide provides a method by which the exposure of silicon and gallium arsenide semiconductor devices to neutron irradiation may be performed in a manner that is repeatable and which will allow comparison to be made of data taken at different facilities. For semiconductors other than silicon and gallium arsenide, applicable validated 1-MeV damage functions are not available in codified National standards. In the absence of a validated 1-MeV damage function, the non-ionizing energy loss (NIEL) or the displacement kerma, as a function incident neutron energy, normalized to the response in the 1 MeV energy region, may be used as an approximation. See Practice E722 for a description of the method used to determine the damage functions in Si and GaAs (3). 1.1 This guide strictly applies only to the exposure of unbiased silicon (Si) or gallium arsenide (GaAs) semiconductor components (integrated circuits, transistors, and diodes) to neutron radiation from a nuclear reactor source to determine the permanent damage in the components. Validated 1-MeV displacement damage functions codified in National Standards are not currently available for other semiconductor materials. 1.2 Elements of this guide, with the deviations noted, may also be applicable to the exposure of semiconductors comprised of other materials except that validated 1-MeV displacement damage functions codified in National standards are not currently available. 1.3 Only the conditions of exposure are addressed in this guide. The effects of radiation on the test sample should be determined using appropriate electrical test methods. 1.4 This guide addresses those issues and concerns pertaining to irradiations with reactor spectrum neutrons. 1.5 System and subsystem exposures and test methods are not included in this guide. 1.6 This guide is applicable to irradiations conducted with the reactor operating in either the pulsed or steady-state mode. The range of interest for neutron fluence in displacement damage semiconductor testing range from approximately 109 to 1016 1-MeV n/cm2. 1.7 This guide does not address neutron-induced single or multiple neutron event effects or transient annealing. 1.8 This guide provides an alternative to Test Method 1017.3, Neutron Displacement Testing, a component of MIL-STD-883 and MIL-STD-750. The Department of Defense has restricted use of these MIL-STDs to programs existing in 1995 and earlier. 1.9 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. ASTM F1190-2011 - 中外标准 - ASTM- 2011/1 - 现行 关键词：dosimetry  electronic component  equivalent monoenergetic neutron fluence  fast burst reactor (FBR)  gallium arsenide  gamma dose  gamma effects  irradiation  neutron fluence  neutron flux  nickel  1 MeV equivalent fluence  radiation  reactor  semiconductor  silicon  sulfur  thermoluminescent dosimeter (TLD)  TRIGA-type reactor：Destructive testing--semiconductors  Electrical conductors (semiconductors)  Electronic devices/instruments/equipment  Exposure tests--electronic components/devices  Fast burst reactors (FBR)  Gamma radiation  Germanium--semiconductor applications  Irradiance/irradiation--semiconductors  1MeV equivalent fluence  Neutron radiation  Nickel electrical/electronic applications  Radiation exposure--electronic components/devices  Reactors  Semiconductor technology  Silicon semiconductors  Thermal neutron radiation  TRIGA-type reactors 10 用共线四探针法测定金属薄膜的薄膜电阻的标准试验方法 - 摘要 1.1 This test method covers the measurement of the sheet resistance of metallic thin films with a collinear four-probe array. It is intended for use with rectangular metallic films between 0.01 and 100 [mu]m thick, formed by deposition of a material or by a thinning process and supported by an insulating substrate, in the sheet resistance range from 10 to 10 [omega]/[open-box] (see 3.1.3). 1.2 This test method is suitable for referee measurement purposes as well as for routine acceptance measurements. 1.3 The values stated in Si units are to be regarded as the standard. The values given in parentheses are for information only. 1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. ASTM F390-2011 - 中外标准 - ASTM- 2011/1 - 现行 关键词：collinear four-point probe  electrical resistance  electrical sheet resistance  four-point probe  resistance  thin films  thin conductive films  thin metallic films 共 7 页 1 2 3 4 5 6 7 下一页 末页 您还可以输入字 请留下有效的联系方式，以便与您联系。 * 姓名 * 邮箱 提交建议 您的建议已提交成功！ 提交失败 是否清除所输入内容 是否 客户服务 ．用户建议 ．邮箱service@wanfangdata.com.cn ．客服电话 4000-115-888   8:00-11:30,13:00-17:00(工作日) 关注我们 ．新浪微博 ．平台百科 ．业务合作 ．数图新服务应用研讨班 广告服务 ．广告形式 ．价格体系 ．广告申请 ．服务保障 ．联系方式 网上商城 ．充值卡 使用帮助 ．注册和登录 ．检索文献 ．如何支付 ．如何充值 ．下载和查看 语种 ．简体中文 ．繁體中文 ．English 知识产权声明| 服务承诺| 联系我们| 人才招聘| 客户服务| 关于我们 京ICP证：010071  互联网出版许可证：新出网证(京)字042号  京公网安备11010802020237号 万方数据知识服务平台--国家科技支撑计划资助项目（编号：2006BAH03B01）©北京万方数据股份有限公司  万方数据电子出版社