电力工业标准-电力网-万方数据知识服务平台

1 电绝缘半导体装置安全性标准 - 摘要
ANSI/UL 1557-2013 - 中外标准 - ANSI- 2013/1 - 现行
关键词：验收定义二极管晶闸管电气工程电绝缘电子设备及元件词汇表标志模数生产生产控制半导体器件试验半导体闸流管晶体管 Acceptance Definitions Diode thyristor Electrical engineering Electrical insulation Electronic equipment and components Glossaries Marking Modules Production Production control Semiconductor devices Testing Thyristors Transistors

2 静电学放电灵敏性试验.人体模式(HBM).组件层次 - 摘要

Establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).
ANSI/ESDA/JEDEC JS-001-2012 - 中外标准 - ANSI- 2012/1 - 现行
关键词：Changes of temperature Checking equipment Classification Components Definitions Dimensions Discharge Electrical components Electrical engineering Electrical measurement Electronic engineering Electronic equipment and components Electrostatic Electrostatic discharges Electrostatics Environment Environmental testing Environmental tests Failure Impulse loadability Integrated circuits Interference susceptibility Measuring equipment Mechanical testing Models Resistance Semiconductor devices Semiconductors Simulation Temperature Testing Visual inspection (testing) Waveforms

3 电绝缘半导体装置安全标准 - 摘要

The proposal includes: 1) First-time ANSI approval for the Standard for Electrically Isolated Semiconductor Devices, UL 1557
ANSI/UL 1557-2011 - 中外标准 - ANSI- 2011/1 - 废止
关键词：Acceptance Definitions Diode thyristor Electrical engineering Electrical insulation Electronic equipment and components Glossaries Marking Modules Production Production control Semiconductor devices Testing Thyristors Transistors

4 展览用展示装置的制造和安装安全性标准 - 摘要

1. Proposed Addition Of Construction, Performance, Marking, and Installation Instruction Requirements For The Investigation Of Booth Stringer Type Cord Sets Intended For Indoor Use For The Purpose Of Illuminating, Animating, Activating, Or Displaying With Respect To Temporary Expositions, Exhibits, Show Conventions, Meetings, or Assemblies Where Display Booths Or Units Are Installed
ANSI/UL 2305-2010 - 中外标准 - ANSI- 2010/1 - 现行
关键词：显示装置电气工程展览设施指示器安装光学元件光电子学生产信号装置直观显示装置 Display units Electrical engineering Exhibition facilities Indicators Installations Optical elements Optoelectronics Production Telltales Visual display units

5 有机晶体管和材料特性的试验方法标准 - 摘要

This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
ANSI/IEEE 1620-2008 - 中外标准 - ANSI- 2008/1 - 现行
关键词：特性记述有机的晶体管 Characterisations Organic Transistors

6 表征基于环形振荡器的有机电晶体管特性的试验方法标准 - 摘要

Recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators are covered. Describes the most common sources of measurement errors, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. Also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators.
ANSI/IEEE 1620.1-2006 - 中外标准 - ANSI- 2006/1 - 现行
关键词：特性记述定义电子设备及元件材料测量技术计量学有机的试验设备试验晶体管 Characterisations Definition Definitions Electronic equipment and components Materials Measuring techniques Metrology Organic Test equipment Testing Transistors

7 超过制造商规定温度范围的半导体装置的使用 - 摘要

Prescribes processes for using semiconductor devices in wider temperature ranges than those specified by the device manufacturer. It applies to any designer or manufacturer of equipment intended to operate under conditions that require semiconductor devices to function in temperature ranges beyond those for which the devices are marketed.
ANSI/EIA 4900-2002 - 中外标准 - ANSI- 2002/1 - 现行

8 半导体器件在制造商规定温度范围外的使用 - 摘要

Prescribes processes for using semiconductor devices in wider temperature ranges than those specified by the device manufacturer. It applies to any designer or manufacturer of equipment intended to operate under conditions that require semiconductor devices to function in temperature ranges beyond those for which the devices are marketed.
ANSI/EIA-4900-2002 - 中外标准 - ANSI- 2002/1 - 废止

9 液晶聚合物(LCP)规范(08.03) - 摘要

This classification system covers liquid crystal polymeric (LCP) materials suitable for injection molding and extrusion. This classification system allows the use of liquid crystal polymers that are recycled, reconstituted, recycled-regrind, recovered, or reprocessed, or a combination thereof, provided that the requirements as stated in this classification system are met. It is the responsibility of the supplier and the buyer of liquid crystal polymers that are recycled, reconstituted, recycled-regrind, recovered, or reprocessed, or a combination thereof, to ensure compliance. The properties included in this classification system are those required to identify the compositions covered. There may be other requirements necessary to identify particular characteristics important to specialized applications. These shall be agreed upon between the user and the supplier, by using suffixes as given in Section 5. This classification system and subsequent line callout (specification) are intended to be a means of calling out plastic materials used in the fabrication of end-use items or parts. It is not intended for the selection of materials. Material selection should be made by those having expertise in the plastics field after careful consideration of the design and the performance required of the part, the environment to which it will be exposed, the fabrication process to be employed, the costs involved, and the inherent properties of the material other than those covered by this classification system. The values stated in SI units are to be regarded as standard. The following precautionary caveat pertains only to the test method portion, Section 11, of this classification system: This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Note 1There is no known ISO equivalent to this classification system.
ANSI/ASTM D5138-1999 - 中外标准 - ANSI- 1999/1 - 现行
关键词：液晶高聚物 polymers liquid crystals

10 半导体和电子元件放射性检查试验方法 - 摘要

This test method provides a standard procedure for nondestructive radiographic examination of semiconductor devices, electronic components, and the materials used for construction of these items. This test method covers the radiographic examination of these items for possible defective conditions such as extraneous material within the sealed case, improper internal connections, voids in materials used for element mounting, or the sealing glass, or physical damage. The quality level and acceptance criteria for the specimens being examined shall be specified in the detail drawing, purchase order or contract. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
ANSI/ASTM E1161-1996 - 中外标准 - ANSI- 1996/1 - 现行
关键词：元部件半导体试验电气工程放射性试验 semiconductors testing electrical engineering components radiographic testing

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